Sputtering and the annealing of radiation damage in single crystal semiconductors
Abstract
Single crystals of germanium, silicon and indium antimonide
were bombarded with medium energy (5, 10, 15 keV) rare gas ions and the
effects arising from the interaction of these ions with target atoms
studied. Incidence of energetic ions in the crystal is followed by
ejection of lattice atoms from their normal positions. The ejection
of atoms from the bombarded surface was studied with two methods,
namely the sputtered atom ejection pattern technique and monitoring of
the sputtering yields using a mass spectrometrie technique. Ejection
patterns were collected from (111) and (100) surfaces of silicon,
(111), (110) and (100) surfaces of germanium and (ill), (110) and (100)
surfaces of indium antimonide. The patterns were examined as
functions of ion mass, ion energy, target temperature and species, and
target orientation. Major ejection directions of target species were
determined. In addition the ejection patterns from the elemental semiconductors
were compared with those from compound semiconductors and
significant differences were found. The results were analyzed on the
basis of current models of anisotropic ejection from semiconductors.
For quantitative evaluation of the sputtering process a mass
spectrometric technique was developed. This technique, which is
reported in detail, was employed in following the variation of relative
sputtering yields with ion beam incidence direction as the target was
rotated about the normal. Critical angles for channelling were determined
from the data, and the results compared with the models of
Onderdelinden (1968) and with the transparency model. In addition both
techniques were used to study the production and insitu annealing of i o n bombardment induced damage. The rate of production was observed to
depend on ion energy , ion mass, target species and orientation , target
temperature and dose rate , Activation energies for the annealing
processes were calculated . The thesis commences with a review of
relevant experimental and theoretical aspects of ion -crystal interaction .
Description
Keywords
Citation
Collections
Source
Type
Book Title
Entity type
Access Statement
License Rights
Restricted until
Downloads
File
Description