The structure and properties of silica thin films and nanowires
| dc.contributor.author | Kim, Taehyun | en_AU |
| dc.date.accessioned | 2018-09-19T23:47:35Z | |
| dc.date.available | 2018-09-19T23:47:35Z | |
| dc.date.copyright | 2009 | |
| dc.date.issued | 2009 | |
| dc.date.updated | 2018-09-19T00:19:43Z | |
| dc.format.extent | xxii, 122 p. | |
| dc.identifier.other | b2444377 | |
| dc.identifier.uri | http://hdl.handle.net/1885/147721 | |
| dc.subject.lcc | TA418.9.T45.K56 2009 | |
| dc.subject.lcsh | Thin films | |
| dc.subject.lcsh | Silica | |
| dc.subject.lcsh | Nanowires | |
| dc.title | The structure and properties of silica thin films and nanowires | |
| dc.type | Thesis (PhD) | |
| local.description.notes | Thesis (Ph.D.)--Australian National University, 2009 | |
| local.identifier.doi | 10.25911/5d63bd810f9d7 | |
| local.mintdoi | mint |
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