Magnetic force microscopy of thin magnetic films
Abstract
The development of the Scanning Tunnelling Microscope (STM) in 1982 by Binnig and Rohrer [1] provided the technological leap that spawned several other types of Scanning Probe Microscopes (SPMs), such as the Atomic Force Microscope (AFM) [2] and Scanning Near Field Optical Microscope (SNOM) [3].
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