Photoluminescence Imaging Diagnosis of Particulate Iron Contamination Derived From HF Dip and Thermal Oxidation
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Baker-Finch, Simeon; McIntosh, Keith
Description
Photoluminescence (PL) imaging identifies contamination occurring in thermal oxidation of p-type crystalline silicon. PL images indicate that the contamination decreases the carrier lifetime from ∼350 to 50 μs and that it is radially symmetric with a d
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2011 |
| Type: | Journal article |
| URI: | http://hdl.handle.net/1885/64064 |
| Source: | IEEE Journal of Photovoltaics |
| DOI: | 10.1109/JPHOTOV.2011.2165699 |
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| File | Description | Size | Format | Image |
|---|---|---|---|---|
| 01_Baker-Finch_Photoluminescence_Imaging_2011.pdf | 612.68 kB | Adobe PDF | Request a copy |
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