Skip navigation
Skip navigation

Photoluminescence Imaging Diagnosis of Particulate Iron Contamination Derived From HF Dip and Thermal Oxidation

Baker-Finch, Simeon; McIntosh, Keith

Description

Photoluminescence (PL) imaging identifies contamination occurring in thermal oxidation of p-type crystalline silicon. PL images indicate that the contamination decreases the carrier lifetime from ∼350 to 50 μs and that it is radially symmetric with a d

CollectionsANU Research Publications
Date published: 2011
Type: Journal article
URI: http://hdl.handle.net/1885/64064
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2011.2165699

Download

File Description SizeFormat Image
01_Baker-Finch_Photoluminescence_Imaging_2011.pdf612.68 kBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator