Measuring the electrical properties of semiconductor nanowires using terahertz conductivity spectroscopy
-
Altmetric Citations
Joyce, Hannah J; Docherty, Callum J.; Yong, Chaw Keong; Wong-Leung, Jennifer; Gao, Qiang; Paiman, Suriati; Jagadish, Chennupati; Lloyd-Hughes, J; Herz, Laura M; Johnston, Michael B; Tan, Hark Hoe
Description
Accurately measuring the electronic properties of nanowires is a crucial step in the development of novel semiconductor nanowire-based devices. With this in mind, optical pump-terahertz probe (OPTP) spectroscopy is ideally suited to studies of nanowires:
Collections | ANU Research Publications |
---|---|
Date published: | 2013 |
Type: | Conference paper |
URI: | http://hdl.handle.net/1885/60832 |
Source: | Proc. SPIE 8923, Micro/Nano Materials, Devices, and Systems, |
DOI: | 10.1117/12.2049016 |
Access Rights: | Open Access |
Download
File | Description | Size | Format | Image |
---|---|---|---|---|
01_Joyce_Measuring_the_electrical_2013.pdf | 335.91 kB | Adobe PDF |
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.
Updated: 17 November 2022/ Responsible Officer: University Librarian/ Page Contact: Library Systems & Web Coordinator