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Size-dependent characterization of embedded Ge nanocrystals: Structural and thermal properties

Araujo, Leandro; Giulian, Raquel; Sprouster, David; Schnohr, Claudia; Llewellyn, David; Kluth, Patrick; Ridgway, Mark C; Cookson, D J; Foran, Garry J

Description

A combination of conventional and synchrotron-based techniques has been used to characterize the size-dependent structural and thermal properties of Ge nanocrystals (NCs) embedded in a silica (a-SiO2) matrix. Ge NC size distributions with four different diameters ranging from 4.0 to 9.0 nm were produced by ion implantation and thermal annealing as characterized with small-angle x-ray scattering and transmission electron microscopy. The NCs were well represented by the superposition of bulklike...[Show more]

CollectionsANU Research Publications
Date published: 2008
Type: Journal article
URI: http://hdl.handle.net/1885/32434
Source: Physical Review B: Condensed Matter and Materials
DOI: 10.1103/PhysRevB.78.094112

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