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X-ray investigation of the crystallization of chalcogenide glasses of the type (As2Se3)1−x:(Tl2Se)x

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Majid, C.A.; Prager, P.R.; Fletcher, Neville H.; Brettell, J.M.

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Amorphous and crystalline states of As2Se3, (As2Se3)3 : Tl2Se and As2Se3 : Tl2Se have been studied using X-ray diffraction techniques. Structural changes arise during the process of annealing in the temperature range between their softening and melting points are reported and their rates investigated. The crystallization temperatures were found to be 105 ± 5 °C, 135 ± 5 °C and 180 ± 5 °C respectively. The unit cell parameters are identified for each of the three resulting crystalline phases,...[Show more]

dc.contributor.authorMajid, C.A.
dc.contributor.authorPrager, P.R.
dc.contributor.authorFletcher, Neville H.
dc.contributor.authorBrettell, J.M.
dc.date.accessioned2020-11-02T02:53:12Z
dc.identifier.issn0022-3093
dc.identifier.urihttp://hdl.handle.net/1885/213270
dc.description.abstractAmorphous and crystalline states of As2Se3, (As2Se3)3 : Tl2Se and As2Se3 : Tl2Se have been studied using X-ray diffraction techniques. Structural changes arise during the process of annealing in the temperature range between their softening and melting points are reported and their rates investigated. The crystallization temperatures were found to be 105 ± 5 °C, 135 ± 5 °C and 180 ± 5 °C respectively. The unit cell parameters are identified for each of the three resulting crystalline phases, that for As2Se3 : Tl2Se being orthorhombic while the other two are monoclinic.
dc.format.mimetypeapplication/pdf
dc.language.isoen_AU
dc.publisherElsevier
dc.rights© 1974 North-Holland Publishing Company
dc.sourceJournal of Non-Crystalline Solids
dc.titleX-ray investigation of the crystallization of chalcogenide glasses of the type (As2Se3)1−x:(Tl2Se)x
dc.typeJournal article
local.description.notesThe author was affiliated with University of New England when the paper was published
local.identifier.citationvolume16
dc.date.issued1974
local.publisher.urlhttps://www.elsevier.com/en-au
local.type.statusPublished Version
local.contributor.affiliationFletcher, N. H., Department of Electronic Materials Engineering, The Australian National University
local.description.embargo2037-12-31
local.bibliographicCitation.issue3
local.bibliographicCitation.startpage365
local.bibliographicCitation.lastpage374
local.identifier.doi10.1016/0022-3093(74)90081-7
CollectionsANU Research Publications

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