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Nanoindentation-induced deformation of Ge

Bradby, J. E.; Williams, J. S.; Wong-Leung, J.; Swain, M. V.; Munroe, P.


The deformation mechanisms of crystalline (100) Ge were studied using nanoindentation, cross sectional transmission electron microscopy (XTEM) and Raman microspectroscopy. For a wide range of indentation conditions using both spherical and pointed indenters, multiple discontinuities were found in the force–displacement curves on loading, but no discontinuities were found on unloading. Raman microspectroscopy, measured from samples which had plastically deformed on loading, showed a spectrum...[Show more]

CollectionsANU Research Publications
Date published: 2002-04-15
Type: Journal article
Source: Applied Physics Letters
DOI: 10.1063/1.1469660


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