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Showing results 1 to 8 of 8
Paper_Characterization_of_oxygen_self_diffusion_in_TiO2_resistive_layers_by_NRP.pdf.jpg

Characterization of oxygen self-diffusion in TiO2 resistive-switching layers by nuclear reaction profiling

Author(s)Sulzbach, M. C.; Selau, F. F.; Trombini, Henrique, et al
TypeJournal article
Date Published15-Feb-2019
Date Created-

Depth profiling of ion-implanted samples by high-energy electron scattering

Author(s)Trombini, Henrique; Vos, Maarten; Elliman, Rob, et al
TypeJournal article
Date Published2020
Date Created-

The effect of ion implantation on reflection electron energy loss spectroscopy: The case of Au implanted Al films

Author(s)Trombini, Henrique; Vos, Maarten; Marmitt, G.G., et al
TypeJournal article
Date Published2020
Date Created-

Elucidating the capability of electron backscattering for 3D nano-structure determination

Author(s)Trombini, Henrique; Vos, Maarten; Reboh, S, et al
TypeJournal article
Date Published2020
Date Created-

The influence of radiation damage on electrons and ion scattering measurements from PVC films

Author(s)Tee, Bryan Pi Ern; Vos, Maarten; Selau, F F, et al
TypeJournal article
Date Published2021
Date Created-
Paper_On_the_energy_loss_straggling_of_protons_in_elemental_solids__the_importance_of_electron_bunching.pdf.jpg

On the energy-loss straggling of protons in elemental solids: The importance of electron bunching

Author(s)Selau, F F; Trombini, Henrique; Fadanelli, Raul C, et al
TypeJournal article
Date Published2021
Date Created-

Profiling As plasma doped Si/SiO2 with molecular ions

Author(s)Trombini, Henrique; Alencar, Igor; Marmitt, G.G., et al
TypeJournal article
Date Published2019
Date Created-
Stopping and straggling.pdf.jpg

Stopping and straggling of 60-250-keV backscattered protons on nanometric Pt films

Author(s)Selau, F F; Trombini, Henrique; Marmitt, G.G., et al
TypeJournal article
Date Published2020
Date Created-
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