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Showing results 1 to 15 of 15

Acceptor-related metastable defects in compensated n-type silicon

Author(s)Rougieux, Fiacre; Phang, Sieu Pheng; Shalav, Avi, et al
TypeConference paper
Date Published2012
Date CreatedNovember 5-9 2012

Activation Kinetics of the Boron-oxygen Defect in Compensated n- and p-type Silicon Studied by High-Injection Micro-Photoluminescence

Author(s)Sun, Ryan; Nguyen, Hieu; Sio, Hang Cheong (Kelvin), et al
TypeJournal article
Date Published2017
Date Created-

Bulk Lifetimes up to 20 ms Measured on Unpassivated Silicon Discs Using Photoluminescence Imaging

Author(s)Chung, Daniel; Mitchell, Bernhard; Goodarzi, Mohsen, et al
TypeJournal article
Date Published2017
Date Created-

Detecting Dopant Diffusion Enhancement at Grain Boundaries in Multicrystalline Silicon Wafers with Microphotoluminescence Spectroscopy

Author(s)Nguyen, Hieu; Mokkapati, Sudha; MacDonald, Daniel
TypeJournal article
Date Published2017
Date Created-

Determination of Dopant Density Profiles of Heavily Boron-Doped Silicon From Low Temperature Microphotoluminescence Spectroscopy

Author(s)Han, Young; Franklin, Evan; MacDonald, Daniel, et al
TypeJournal article
Date Published2017
Date Created-
01_Sio_Electrical_properties_of_2012.pdf.jpg

Electrical properties of different types of grain boundaries in multicrystalline silicon by photoluminescence imaging

Author(s)Sio, Hang Cheong (Kelvin); Trupke, T; Phang, Sieu Pheng, et al
TypeConference paper
Date Published2012
Date CreatedSeptember 24-28 2012

Growth of Oxygen Precipitates and Dislocations in Czochralski Silicon

Author(s)Rougieux, Fiacre; Nguyen, Hieu; MacDonald, Daniel, et al
TypeJournal article
Date Published2017
Date Created-

Impact of minority-impurity scattering on the carrier mobility in compensated silicon

Author(s)Rougieux, Fiacre; Forster, Maxime; MacDonald, Daniel, et al
TypeConference paper
Date Published2012
Date CreatedNovember 5-9 2012

Laser chemical processing (LCP) doping formed through differenct dielectric layers

Author(s)Yang, Xinbo; Fell, Andreas; Xu, Lujia, et al
TypeConference paper
Date Published2013
Date CreatedSeptember 30-October 4 2013

Microscopic Distributions of Defect Luminescence from Subgrain Boundaries in Multicrystalline Silicon Wafers

Author(s)Nguyen, Hieu; Jensen, Mallory Ann; Li, Li, et al
TypeJournal article
Date Published2017
Date Created-

Optical Evaluation of Silicon Wafers With Rounded Rear Pyramids

Author(s)McIntosh, Keith; Zin, Ngwe Soe; Nguyen, Hieu, et al
TypeJournal article
Date Published2017
Date Created-

Photoluminescence imaging for net doping measurements of surface limited silicon wafers

Author(s)Lim, Siew Yee; Forster, Maxime; Zhang, Xinyu, et al
TypeConference paper
Date Published2012
Date CreatedNovember 5-9 2012

Photoluminescence Spectra of Moderately Doped, Compensated Silicon Si:P,B at 79-300 K

Author(s)Liu, Anyao; Nguyen, Hieu; MacDonald, Daniel
TypeJournal article
Date Published2017
Date Created-

Studying precipitation and dissolution of iron in multicrystalline silicon wafers during annealing

Author(s)Liu, An Yao; Walters, Daniel; MacDonald, Daniel
TypeConference paper
Date Published2012
Date CreatedNovember 5-9 2012

Uncertainty in Photoluminescence Metrology on Multicrystalline Silicon Bricks and Cross Validation With Wafers

Author(s)Chung, Daniel; Mitchell, Bernhard; Goodarzi, Mohsen, et al
TypeJournal article
Date Published2017
Date Created-
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