Latham, S. J.Varslot, T. K.Sheppard, A. P.2025-12-172025-12-171446-1811ORCID:/0000-0001-9792-4143/work/160800056ORCID:/0000-0001-8033-4665/work/163535402https://hdl.handle.net/1885/733796179Micro-ct imaging allows probing of material 3D structure down to the micrometre scale. However, often there exists structure at the sub-micrometre scale which significantly inuences the macrophysical properties of the material. One possible solution for mitigating this micro-CT resolution limitation is to incorporate information from higher resolution Back-scattered Scanning Electron Microscopy (bsem) imaging techniques. A first step toward incorporating this high resolution data into micro-ct models is to align the bsem 2D image(s) with the corresponding region(s) of the micro-CT 3D image. This article presents an automated multi-start multi-resolution parallel registration algorithm which has been successfully used to achieve accurate alignment of bsem and micro-ct image pairs.en200884896694069