Lenzini, FrancescoPoddubny, Alexander N.Titchener, JamesFisher, PaulBoes, AndreasKasture, SachinHaylock, BenVilla, MatteoMitchell, ArnanSolntsev, Alexander S.Sukhorukov, Andrey A.Lobino, Mirko2026-01-012026-01-019781509062904https://hdl.handle.net/1885/733799320We propose and demonstrate a new method for the characterization of nonlinear multimode integrated devices that reconstruct the biphoton state produced trough spontaneous parametric down-conversion (SPDC) using classical sum-frequency generation measurements. The proposed method is experimentally demonstrated by predicting the state generated from a multi-channel integrated nonlinear waveguide device.2enPublisher Copyright: © 2017 Institute of Electrical and Electronics Engineers Inc. All rights reserved.Quantum tomography of a nonlinear photonic circuit by classical sum-frequency generation measurements2017-11-2210.1109/CLEOPR.2017.811866985044177079