Walters, DanielLiu, An YaoFranklin, EvanMacDonald, DanielMitchell, BernhardTrupke, T2015-12-07June 3-8 29781467300643http://hdl.handle.net/1885/25301We investigate the impact of point-spread in the silicon CCD sensor of a BT Imaging LIS-R1 luminescence imaging system. It is found that an experimental definition of the point-spread function allows for a significant restoration of CCD point-spread to be achieved. A comparison with short-pass filtering is performed, demonstrating that point-spread will still have a measurable influence on image quality while reducing the luminescence signal and increasing the relative noise level. An implementation of point-spread deconvolution is presented at a multi-crystalline silicon grain boundary, illustrating a practical enhancement of resolution in a typical high-contrast scenario. The characteristics of the point-spread presented here are specific to the experimental apparatus investigated, but the procedure described is universally applicable.Keywords: CCD sensors; Contrast Enhancement; Experimental apparatus; High contrast; Luminescence imaging; Luminescence signals; Multi-crystalline silicon; Noise levels; Point-Spread function; Deconvolution; Grain boundaries; Luminescence deconvolution; luminescence imaging; point-spread function201210.1109/PVSC.2012.63176242016-02-24