Xu, TienanLee, Woei Ming2025-06-112025-06-11ORCID:/0000-0002-3912-6095/work/167893732http://www.scopus.com/inward/record.url?scp=85136430578&partnerID=8YFLogxKhttps://hdl.handle.net/1885/733759058We demonstrate a new lightfield algorithm optimized for lightfield microscopy with oblique plane illumination. Our depth mapping algorithm improves sectioning by a factor of 2 over the conventional methods.enPublisher Copyright: © 2022 The Author(s).Optical sectioning by computational depth mapping for oblique illuminated lightfield imaging202210.1364/TRANSLATIONAL.2022.JTu3A.1885136430578