Gibson, Bradley KHuntington, Shane TRubanov, SOlivero, PDigweed-Lyytikainen, KCanning, JLove, John2009-06-012010-12-202009-06-012010-12-20Optics Express 13.22 (2005): 9023-90281094-4087http://hdl.handle.net/10440/355http://digitalcollections.anu.edu.au/handle/10440/355This paper presents a technique to expose and characterize nano-structured hole arrays in tapered photonic crystal fibers. Hole array structures are examined with taper outer diameters ranging from 12.9 μm to 1.6 μm. A combined focused ion beam milling and scanning electron microscope system was used to expose and characterize the arrayed air-silica structures. Results from this combined technique are presented which resolve hole-to-hole pitch sizes and hole diameters in the order of 120 nm and 60 nm, respectively.6 pages"OSA will grant the authors permission to deposit the publisher’s pdf from their Optics Express articles into the repository with the proper citation (reference number or journal /volume/page/year citation)." - from email received from Authorized Agent, The Optical Society, 27/05/10fiber opticslasers, carbon dioxidefiber characterizationfiber optics imagingscanning microscopyExposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique2005-10-3110.1364/OPEX.13.0090232015-12-12