Lenzini, FrancescoPoddubny, AlexanderTitchener, JamesFisher, PaulBoes, AndreasKasture, SachinHaylock, BenVilla, MatteoMitchell, A.Solntsev, AlexanderSukhorukov, AndreyLobino, Mirko2020-06-2931 July 209781509062904http://hdl.handle.net/1885/205608We propose and demonstrate a new method for the characterization of nonlinear multimode integrated devices that reconstruct the biphoton state produced trough spontaneous parametric down-conversion (SPDC) using classical sum-frequency generation measurements. The proposed method is experimentally demonstrated by predicting the state generated from a multi-channel integrated nonlinear waveguide device.application/pdfen-AU© 2017 IEEEQuantum tomography of a nonlinear photonic circuit by classical sum-frequency generation measurements201710.1109/CLEOPR.2017.81186692020-01-27