Zhang, XinyuWan, YimaoBullock, JamesAllen, ThomasCuevas, Andres2018-11-292018-11-290003-6951http://hdl.handle.net/1885/151996application/pdfLow resistance Ohmic contact to p-type crystalline silicon via nitrogen-doped copper oxide films201610.1063/1.49605292018-11-29