Arslan, D.Chong, K. E.Neshev, D. N.Pertsch, T.Kivshar, Y. S.Staude, I.2025-12-312025-12-3197815090673679781509067367ORCID:/0000-0002-4508-8646/work/162528823ORCID:/0000-0002-3410-812X/work/163397968https://hdl.handle.net/1885/733798535enSilicon huygens' metasurfaces at oblique incidence201785039786458