Dogra, RSharma, A KByrne, AidanRidgway, Mark C2015-12-10December 39780735410442http://hdl.handle.net/1885/59715The perturbed angular correlation technique is very well suited to characterize the structural, dynamic and electronic properties of impurity or impurity-defect complexes on an atomic scale. Using radioisotope probe 100Pd/100Rh, such measurements have beeKeywords: Defects; Palladium; Perturbed Angular Correlation; Silicon201210.1063/1.47103582016-02-24