Xu, JinbaoLiu, YunWithers, Raymond2015-12-100167-2738http://hdl.handle.net/1885/56619Multilayered BaTiO3(BTO)/Bi0.5K0.5TiO3 (BKT) thin films have been fabricated on Pt/Ti/SiO2/Si substrates using a metalloorganic decomposition process. XRD investigation of the resultant BTO/BKT multilayered thin films shows that they retain a perovskite-related structure type. They also exhibit a well-defined, polarization-electric field hysteresis loop with a measured remnant polarization (2Pr) of 5 μC/cm2 at an applied electric field of 250 kV/cm. The measured dielectric constant and dielectric loss at 10 kHz is 470 and 0.07 respectively. These multilayer BTO/BKT films maintain an excellent fatigue-free character even after 109 switching cycles. The mechanism associated with the enhancement of the electrical properties of the synthesized BTO/BKT films is also discussed. CrownKeywords: Applied electric field; Dielectric constants; Electric field hysteresis loop; Electrical characteristic; Electrical property; Ferroelectric property; Metallo-organic decompositions; Multi-layered; Multilayered thin films; Perovskite related structure; Rem Dielectric property; Ferroelectric property; Multilayer; Thin films200910.1016/j.ssi.2009.05.0142016-02-24