Petravic, MladenGao, QiangLlewellyn, DavidDeenapanray, PrakashMacDonald, DanielCrotti, C2015-12-100009-2614http://hdl.handle.net/1885/54598We have used high-resolution near-edge X-ray absorption fine structure spectroscopy to study the N 1s → 1π* resonance of N2 trapped below the surface of several compound semiconductors. The vibrational fine structure, observed from all samples under coKeywords: Absorption; Molecular vibrations; Nitrogen; Probability; Semiconductor materials; X ray analysis; Fine structure spectroscopy; Molecular nitrogen; Vibrational levels; X-ray absorption; Molecular physicsBroadening of vibrational levels in X-ray absorption spectroscopy of molecular nitrogen in compound semiconductors200610.1016/j.cplett.2006.05.0562015-12-09