Henderson, MarkGibaud, AlainBardeau, Jean-FrancoisRennie, Adam CharlesWhite, John2015-12-130921-4526http://hdl.handle.net/1885/76127A self-assembled zirconia-based film, produced at the air-water interface using sodium dodecyl sulphate (SDS) as the template, has been characterised by energy-dispersive X-ray reflectometry, X-ray diffraction, and X-ray fluorescence analysis. Long-rangeKeywords: Air; Diffraction; Interfaces (materials); Micelles; Principal component analysis; Raman spectroscopy; Self assembly; Thin films; Water; X ray diffraction analysis; Air-water interface; Bragg diffraction; Inorganic materials; Time-resolved X-ray reflectome Air-water interface; Thin film; Time-resolved X-ray reflectometry; Zirconium oxideA zirconium oxide film self-assembled at the air-water interface200510.1016/j.physb.2004.11.0132015-12-11