Weijers, Tessica Diana Maria2018-10-242018-10-242002b2128043http://hdl.handle.net/1885/148602xi, 214 p.en-AUQC702.7.H42W45 2002Heavy ionsSilicon diodesSemiconductors SurfacesAccurate multi-element energy spectroscopy with ion detectors for elastic recoil detection analysis200210.25911/5d626eb9094552018-09-21