Senden, Tim J.Drummond, Calum J.Kékicheff, Patrick2026-01-052026-01-050743-7463ORCID:/0000-0001-6808-7219/work/171154440https://hdl.handle.net/1885/733803655The relationship between atomic force microscope (AFM) surface images and tip-sample surface forces in aqueous electrolyte solutions is examined. Two novel AFM imaging modes, designated as electrical double layer and “hydration”, are compared with the conventional Born “contact” mode of imaging. Fourier analysis suggests that AFM images may reveal correlation lengths and order parameters characteristic of surface forces.5en1994-02-0110.1021/la00014a0040028378151