MacDonald, DanielCuevas, AndresMcIntosh, KeithBarbosa, LaetitiaDe Ceuster, Denis2015-12-132015-12-13June 6 2003936338191http://hdl.handle.net/1885/85613Impact of Cr, Fe, Ni, Ti and W surface contamination on diffused and oxidised a-type crystalline silicon wafers20052015-12-12