Characterization of Passivation Layer Losses using on-chip Chalcogenide Glass Resonators with Ultra-high Q-factor in the Mid-infrared Region

Suk, DaewonKo, KiyoungKim, JingyuPark, Sang Hee KoWang, RongpingChoi, Duk YongLee, Hansuek2025-05-232025-05-239781957171395ORCID:/0000-0002-5339-3085/work/183659750http://www.scopus.com/inward/record.url?scp=85215105636&partnerID=8YFLogxKhttps://hdl.handle.net/1885/733750802We optically characterize the absorption loss and surface property of nanometer-thin Al2O3 and TiO2 passivation layers using chalcogenide glass-based on-chip resonators with ultrahigh Q-factor in the mid-IR region.2enCLEO 2024 © Optica Publishing Group 2024 © 2024 The Author(s)ChalcogenidesElectro-optical waveguidesGlassLasers and electroopticsOptical lossesOptical resonatorsPassivationQ-factorResonatorsSystem-on-chipCharacterization of Passivation Layer Losses using on-chip Chalcogenide Glass Resonators with Ultra-high Q-factor in the Mid-infrared Region202410.1364/cleo_si.2024.sm2d.585215105636