Howard, J.Carraro, L.Puiatti, M. E.Sattin, F.Scarin, P.Valisa, M.Zaniol, B.König, R.Chung, J.2015-11-232015-11-230034-6748http://hdl.handle.net/1885/16597A coherence-based, or interferometric approach to spectral analysis of charge-exchange recombination (CXR) emission radiation from high-temperature plasma probed or heated using energetic neutral beams, offers a number of advantages over wavelength-domain instruments. The spectral-line shift and broadening are obtained from measurements of the spectralcoherence at a given fixed time delay. The coherence is monitored by first approximately isolating the spectral line of interest using an interference filter and subsequently imaging the spectral scene using a field-widened electro-optic path-delay-modulated polarization interferometer.Interferometers have the advantage of high-light throughput (no slit aperture). Moreover, because the spectral information is encoded at harmonics of the electro-optic modulation frequency, a single detector suffices to capture the spectral information, thereby opening the possibility for time-resolved two-dimensional spectralimaging. When unwanted spectral features are passed by the interference filter, the interpretation of the coherence phase and amplitude images can become ambiguous. By modulating the particle beam source, however, we show that coherence imaging using a single-delay modulatable interferometer can distinguish and characterize the Doppler-broadened CXR emission component against a significant background of continuum and intrinsic radiation, or pollution from nearby spectral features.http://www.sherpa.ac.uk/romeo/issn/0034-6748..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 23/11/15). Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments and may be found at https://doi.org/10.1063/1.1537036Keywords: Electrooptical effects; Frequency modulation; Imaging systems; Interferometers; Particle beams; Plasma heating; Polarization; Spectroscopic analysis; Charge-exchange recombination spectroscopy (CXRS); Plasma confinement2003-0310.1063/1.15370362015-12-08