Effective Lifetime Characterisation of a Room Temperature Meta-Stable Defect in N-Type 5 ΩCM FZ Phosphorus-Diffused Oxide-Passivated Silicon

Thomson, AndrewMcIntosh, KeithMacDonald, Daniel2015-12-08Septemberhttp://hdl.handle.net/1885/28976Effective Lifetime Characterisation of a Room Temperature Meta-Stable Defect in N-Type 5 ΩCM FZ Phosphorus-Diffused Oxide-Passivated Silicon20082015-12-08