Khalil, Ali SChadderton, LewisStewart, AndrewRidgway, Mark CLlewellyn, DavidByrne, Aidan2015-12-131350-4487http://hdl.handle.net/1885/81241Transmission electron microscopy (TEM) and atomic force microscopy (AFM) have been used to study radiation effects in 200 MeV Au ion-irradiated InP single crystals. The observations reveal the presence of individual tracks of intermittent nature about 10Keywords: Amorphization; Amorphous materials; Atomic force microscopy; Heavy ions; Irradiation; Radiation effects; Single crystals; Surface roughness; Transmission electron microscopy; Ion irradiation; Track cores; Track formation; Semiconducting indium phosphide200510.1016/j.radmeas.2005.05.0182015-12-11