von Nessi, G. T.Hole, M. J.2015-12-102015-12-100034-6748http://hdl.handle.net/1885/69690A unified, Bayesian inference of midplane electron temperature and density profiles using both Thompson scattering (TS) and interferometric data is presented. Beyond the Bayesian nature of the analysis, novel features of the inference are the use of a Gaussian process prior to infer a mollification length-scale of inferred profiles and the use of Gauss-Laguerre quadratures to directly calculate the depolarisation term associated with the TS forward model. Results are presented from an application of the method to data from the high resolution TS system on the Mega-Ampere Spherical Tokamak, along with a comparison to profiles coming from the standard analysis carried out on that system.This work was jointly funded by the Australian Government through International Science Linkages Grant No. CG130047, the Australian National University, the RCUK Energy Programme under Grant No. EP/I501045, and the European Communities under the contract of Association between EURATOM and CCFE.http://www.sherpa.ac.uk/romeo/issn/0034-6748..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 11/12/15). Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments and may be found at https://doi.org/10.1063/1.4811378Keywords: Bayesian Analysis; Bayesian inference; Gaussian process priors; Gaussian Processes; Interferometric data; Mega-ampere spherical tokamaks; Standard analysis; Thomson scattering; Bayesian networks; Electron temperature; Gaussian distribution; Inference engi2013-06-2510.1063/1.48113782016-02-24