Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n

Praena, JFerrer, F JVollenberg, WSabaté-Gilarte, MFernández, BGarcía-López, JPorras, IQuesada, J.M.Altstadt, SAndrzejewski, J.Wallner, Anton2020-04-150168-9002http://hdl.handle.net/1885/202979Thin S-33 samples for the study of the S-33(n,alpha)Si-30 cross-section at the n_TOF facility at CERN were made by thermal evaporation of S-33 powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of S-33 has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.This work was supported by the Spanish projects FPA2013-47327- C2-1-R, FPA2014-53290-C2-2-P, FPA2016-77689-C2-1-R, J. de Andalucía P11-FQM-8229, FIS2015-69941-C2-1-P (MINECO-FEDER, EU), AECC-PS16163811PORR and the funding agencies of the participating institutesapplication/pdfen-AU© 2018 The Authors.http://creativecommons.org/licenses/by/4.0/Preparation and characterization of S-33 samples for S-33(n,alpha)Si-30 cross-section measurements at the n_TOF facility at CERN201810.1016/j.nima.2018.02.0552019-11-25CC BY license