DAI, XiMcIntosh, Keith2015-12-13June 20-259781424458912http://hdl.handle.net/1885/83917PECVD SiNx antireflection coatings are found to suppress the degradation of an underlying oxide during "damp-heat" exposure. Samples are submitted to 85 °C and 85% relative humidity, replicating the damp-heat conditions of the standard reliability testsKeywords: A-thermal; Damp heat; Diffusion of water; Elevated temperature; Emitter saturation current density; Heat conditions; High efficiency; Oxide thickness; Presence of water; PV modules; Relative humidities; Reliability test; Silicon cells; Atmospheric humidit201010.1109/PVSC.2010.56167762016-02-24