Holt, StephenForan, Garry JWhite, John2015-12-130743-7463http://hdl.handle.net/1885/93790Clear evidence for hexagonal crystallinity in surfactant-templated silicate films growing at the air-water interface is presented for the first time. Grazing incidence synchrotron radiation diffraction shows the development of diffraction spots just as the `induction phase', identified previously, is completed. The observed hexagonal diffraction represents the in-plane ordering of the first two-three layers of film formed at the interface.Keywords: Crystal structure; Film growth; Phase interfaces; Synchrotron radiation; X ray crystallography; Grazing incidence X-ray diffraction (GIXD) analysis; Silicates199910.1021/la981390u2015-12-12