Kim, Tae-HyunNawaz (Saleh), MuhammadKim, Sung-IVenkatachalam, DineshBelay, KidaneBurgess, AndrewStrumpp, StephanElliman, Robert2015-12-10December 19781424473335http://hdl.handle.net/1885/51745Resistive switching properties of polycrystalline NiOx dielectric films are investigated utilizing thermo-chemical model in which a field-induced conductive filament is formed and broken by joule heating.Keywords: Conductive filaments; Polycrystalline; Resistance switching; Resistive switching; Thermochemical models; Conductive films; Dielectric films; Microelectronics201010.1109/COMMAD.2010.56997512016-02-24