1.6 MHz scanning rate direct absorption temperature measurements using a single vertical-cavity surface-emitting laser diode
Date
2018
Authors
Kaebe, Benjamin D
Robins, Nicholas
Boyson, Toby K.
Kleine, H.
O’Byrne, Sean
Journal Title
Journal ISSN
Volume Title
Publisher
Optical Society of America
Abstract
This paper presents 1.6 MHz scan rate, non-intrusive, time-resolved temperature measurements of a normal shock reflection from a plane end wall within a shock tube. A vertical-cavity surface-emitting laser (VCSEL) was used to conduct tunable diode laser absorption spectroscopy with water vapor as the probe species. The results are compared with analytical predictions. Temperatures measured with this technique agree within a single-scan standard deviation of ±33 K with calculated temperatures at a VCSEL modulation frequency of 800 kHz, which is sufficiently rapid enough to be used to investigate highly transient shock wave interaction processes.
Description
Keywords
Citation
Collections
Source
Applied Optics
Type
Journal article
Book Title
Entity type
Access Statement
License Rights
Restricted until
2037-12-31
Downloads
File
Description