Comment on "Mechanisms for the anomalous dependence of carrier lifetime on injection level and photoconductance on light intensity" [J. Appl. Phys. 89, 332 (2001)]
Date
Authors
Macdonald, D
Cuevas, Andres
Journal Title
Journal ISSN
Volume Title
Publisher
American Institute of Physics
Abstract
In a recent article [J. Appl. Phys. 89, 332 (2001)], Karazhanov proposed a single-level
recombination model as an explanation for the anomalous dependence of the carrier lifetime on
injection-level observed in cast multicrystalline silicon. This approach contrasts with previous
models which involved the use of two distinct levels, one causing recombination and the other only
trapping. The purpose of this comment is to outline some critical considerations which suggest that
only a two-level (or indeed a multi-level) model can satisfactorily explain the experimental
observations.
Description
Citation
Journal of Applied Physics 90.5 (2001): 2621-2
Collections
Source
Journal of Applied Physics
Type
Book Title
Entity type
Access Statement
License Rights
Restricted until
Downloads
File
Description