Cultural advice

The Australian National University acknowledges, celebrates and pays our respects to the Ngunnawal and Ngambri people of the Canberra region and to all First Nations Australians on whose traditional lands we meet and work, and whose cultures are among the oldest continuing cultures in human history.

Aboriginal and Torres Strait Islander peoples are advised that ANU Library collections may include images, names, voices, and other representations of deceased persons.

Material in the collection may contain terms, language or views that reflect the period in which the item was created and may be considered inappropriate today.

Comment on "Mechanisms for the anomalous dependence of carrier lifetime on injection level and photoconductance on light intensity" [J. Appl. Phys. 89, 332 (2001)]

Loading...
Thumbnail Image

Authors

Macdonald, D
Cuevas, Andres

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physics

Abstract

In a recent article [J. Appl. Phys. 89, 332 (2001)], Karazhanov proposed a single-level recombination model as an explanation for the anomalous dependence of the carrier lifetime on injection-level observed in cast multicrystalline silicon. This approach contrasts with previous models which involved the use of two distinct levels, one causing recombination and the other only trapping. The purpose of this comment is to outline some critical considerations which suggest that only a two-level (or indeed a multi-level) model can satisfactorily explain the experimental observations.

Description

Citation

Journal of Applied Physics 90.5 (2001): 2621-2

Source

Journal of Applied Physics

Book Title

Entity type

Access Statement

License Rights

Restricted until

Downloads