Application of junction capacitance measurements to the characterization of solar cells

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dc.contributor.authorRecart, Federico
dc.contributor.authorCuevas, Andres
dc.date.accessioned2015-12-07T22:16:27Z
dc.date.issued2006
dc.date.updated2015-12-07T07:52:25Z
dc.description.abstractThe quasi-static capacitance-voltage (C-V) technique measures the dependence of junction capacitance on the bias voltage by applying a slow, reverse-bias voltage ramp to the solar cell in the dark, using simple circuitry. The resulting C-V curves contain
dc.identifier.issn0018-9383
dc.identifier.urihttp://hdl.handle.net/1885/18040
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE Inc)
dc.sourceIEEE Transactions on Electron Devices
dc.subjectKeywords: Capacitance measurement; Electric conductivity; Electric potential; Electric space charge; Photovoltaic cells; Semiconductor doping; Semiconductor junctions; Substrates; Capacitance-voltage (C-V); Emitter doping; Junction capacitance; Resistivity substrat Capacitance; Photovoltaic cells; Space charge region (SCR)
dc.titleApplication of junction capacitance measurements to the characterization of solar cells
dc.typeJournal article
local.bibliographicCitation.issue3
local.bibliographicCitation.lastpage448
local.bibliographicCitation.startpage442
local.contributor.affiliationRecart, Federico, College of Engineering and Computer Science, ANU
local.contributor.affiliationCuevas, Andres, College of Engineering and Computer Science, ANU
local.contributor.authoremailu9308750@anu.edu.au
local.contributor.authoruidRecart, Federico, v003812
local.contributor.authoruidCuevas, Andres, u9308750
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor090604 - Microelectronics and Integrated Circuits
local.identifier.absfor091099 - Manufacturing Engineering not elsewhere classified
local.identifier.ariespublicationu4251866xPUB3
local.identifier.citationvolume53
local.identifier.doi10.1109/TED.2006.870846
local.identifier.scopusID2-s2.0-33244474412
local.identifier.uidSubmittedByu4251866
local.type.statusPublished Version

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