Broadening of vibrational levels in X-ray absorption spectroscopy of molecular nitrogen in compound semiconductors
Date
2006
Authors
Petravic, Mladen
Gao, Qiang
Llewellyn, David
Deenapanray, Prakash
MacDonald, Daniel
Crotti, C
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Publisher
Elsevier
Abstract
We have used high-resolution near-edge X-ray absorption fine structure spectroscopy to study the N 1s → 1π* resonance of N2 trapped below the surface of several compound semiconductors. The vibrational fine structure, observed from all samples under co
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Keywords: Absorption; Molecular vibrations; Nitrogen; Probability; Semiconductor materials; X ray analysis; Fine structure spectroscopy; Molecular nitrogen; Vibrational levels; X-ray absorption; Molecular physics
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Source
Chemical Physics Letters
Type
Journal article
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2037-12-31
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