Critical thickness for InAs quantum dot formation on (3 1 1)B InP substrates

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dc.contributor.authorCaroff, Philippe
dc.contributor.authorBertru, N
dc.contributor.authorLu, W
dc.contributor.authorElias, G
dc.contributor.authorDehaese, O
dc.contributor.authorLetoublon, A
dc.contributor.authorLe Corre, A
dc.date.accessioned2015-12-13T22:45:39Z
dc.date.issued2009
dc.date.updated2016-02-24T09:41:09Z
dc.description.abstractWe report on the critical thickness for InAs quantum dot (QD) formation on (3 1 1)B InP substrates. Firstly, critical thicknesses for InAs QD formation on InP surfaces have been measured by reflection high-energy electron diffraction. Large change of the
dc.identifier.issn0022-0248
dc.identifier.urihttp://hdl.handle.net/1885/79888
dc.publisherElsevier
dc.sourceJournal of Crystal Growth
dc.subjectKeywords: A1. Reflection high-energy electron diffraction; A3. Molecular beam epitaxy; A3. Quantum dots; Capping layers; Critical thickness; Double-cap procedures; InAs; InAs quantum dots; Inp; InP substrates; Mass transports; Substrate temperatures; Crystal growth A1. Reflection high-energy electron diffraction; A3. Molecular beam epitaxy; A3. Quantum dots
dc.titleCritical thickness for InAs quantum dot formation on (3 1 1)B InP substrates
dc.typeJournal article
local.bibliographicCitation.issue9
local.bibliographicCitation.lastpage2629
local.bibliographicCitation.startpage2626
local.contributor.affiliationCaroff, Philippe, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationBertru, N, FOTON (Fonctions Optiques pour les Technologies de l'informatiON)
local.contributor.affiliationLu, W, FOTON (Fonctions Optiques pour les Technologies de l'informatiON)
local.contributor.affiliationElias, G, FOTON (Fonctions Optiques pour les Technologies de l'informatiON)
local.contributor.affiliationDehaese, O, FOTON (Fonctions Optiques pour les Technologies de l'informatiON)
local.contributor.affiliationLetoublon, A, FOTON (Fonctions Optiques pour les Technologies de l'informatiON)
local.contributor.affiliationLe Corre, A, FOTON (Fonctions Optiques pour les Technologies de l'informatiON)
local.contributor.authoruidCaroff, Philippe, u5309137
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor100706 - Nanofabrication, Growth and Self Assembly
local.identifier.absfor020406 - Surfaces and Structural Properties of Condensed Matter
local.identifier.ariespublicationf5625xPUB8252
local.identifier.citationvolume311
local.identifier.doi10.1016/j.jcrysgro.2009.02.048
local.identifier.scopusID2-s2.0-65349122913
local.type.statusPublished Version

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