Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon
Date
2016
Authors
Grant, Nicholas
Markevich, Vladimir P
Mullins, Jack
Rougieux, Fiacre
Peaker, Anthony R
MacDonald, Daniel
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Wiley-VCH Verlag GMBH
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Physica Status Solidi: Rapid Research Letters
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Journal article
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2037-12-31
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