The impact of silicon CCD photon spread on quantitative analyses of luminescence images

dc.contributor.authorWalters, Daniel
dc.contributor.authorFell, Andreas
dc.contributor.authorFranklin, Evan
dc.contributor.authorMacDonald, Daniel
dc.contributor.authorMitchell, Bernhard
dc.contributor.authorTrupke, Thorsten
dc.date.accessioned2015-12-13T22:38:01Z
dc.date.issued2014
dc.date.updated2015-12-11T09:40:00Z
dc.description.abstractCommercial and R&D photoluminescence imaging systems commonly employ indirect bandgap silicon charge-coupled device (CCD) imaging sensors. Silicon is a weak absorber of the near-infrared band-to-band emission of silicon, and significant lateral spreading
dc.identifier.issn2156-3381
dc.identifier.urihttp://hdl.handle.net/1885/77361
dc.publisherIEEE Electron Devices Society
dc.sourceIEEE Journal of Photovoltaics
dc.titleThe impact of silicon CCD photon spread on quantitative analyses of luminescence images
dc.typeJournal article
local.bibliographicCitation.issue1
local.bibliographicCitation.lastpage373
local.bibliographicCitation.startpage368
local.contributor.affiliationWalters, Daniel, College of Engineering and Computer Science, ANU
local.contributor.affiliationFell, Andreas, College of Engineering and Computer Science, ANU
local.contributor.affiliationFranklin, Evan, College of Engineering and Computer Science, ANU
local.contributor.affiliationMacDonald, Daniel, College of Engineering and Computer Science, ANU
local.contributor.affiliationMitchell, Bernhard, University of New South Wales
local.contributor.affiliationTrupke, Thorsten, University of New South Wales
local.contributor.authoruidWalters, Daniel, u4131215
local.contributor.authoruidFell, Andreas, u5076423
local.contributor.authoruidFranklin, Evan, u4038737
local.contributor.authoruidMacDonald, Daniel, u9718154
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor090600 - ELECTRICAL AND ELECTRONIC ENGINEERING
local.identifier.ariespublicationf5625xPUB6233
local.identifier.citationvolume4
local.identifier.doi10.1109/JPHOTOV.2013.2287912
local.identifier.scopusID2-s2.0-84891555984
local.identifier.thomsonID000329038800056
local.type.statusPublished Version

Downloads

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
01_Walters_The_impact_of_silicon_CCD_2014.pdf
Size:
648.14 KB
Format:
Adobe Portable Document Format