Energy dependent saturation width of swift heavy ion shaped embedded Au nanoparticles
dc.contributor.author | Kluth, P. | |
dc.contributor.author | Giulian, R. | |
dc.contributor.author | Sprouster, D. J. | |
dc.contributor.author | Schnohr, C. S. | |
dc.contributor.author | Byrne, A. P. | |
dc.contributor.author | Cookson, D. J. | |
dc.contributor.author | Ridgway, M. C. | |
dc.date.accessioned | 2015-10-21T23:04:26Z | |
dc.date.available | 2015-10-21T23:04:26Z | |
dc.date.issued | 2009-03-17 | |
dc.date.updated | 2016-02-24T10:00:19Z | |
dc.description.abstract | The transformation of Aunanoparticles (NPs) embedded in SiO₂ from spherical to rod-like shapes induced by swift heavy ion irradiation has been studied. Irradiation was performed with ¹⁹⁷Au ions at energies between 54 and 185 MeV. Transmission electron microscopy and small angle x-ray scatteringmeasurements reveal an energy dependent saturation width of the NP rods as well as a minimum size required for the NPs to elongate. The NP saturation width is correlated with the ion track diameter in the SiO₂. NP melting and in-plane strain in the irradiatedSiO₂ are discussed as potential mechanisms for the observed deformation. | |
dc.description.sponsorship | P.K. and M.C.R. thank the Australian Research Council for support. P.K., R.G., D.J.S., and M.C.R. were supported by the Australian Synchrotron Research Program, funded by the Commonwealth of Australia via the Major National Research Facilities Program. | en_AU |
dc.format | 3 pages | |
dc.identifier.issn | 0003-6951 | en_AU |
dc.identifier.uri | http://hdl.handle.net/1885/16011 | |
dc.publisher | American Institute of Physics (AIP) | |
dc.rights | http://www.sherpa.ac.uk/romeo/issn/0003-6951..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 22/10/15). Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at https://doi.org/10.1063/1.3099971 | |
dc.source | Applied Physics Letters | |
dc.subject | Keywords: Heavy ions; Irradiation; Nanoparticles; Silicon compounds; Transmission electron microscopy; Au nanoparticles; Energy dependents; In-plane strains; Ion tracks; Potential mechanisms; Small - angle X-ray scatterings; Swift heavy ion irradiations; Swift heav | |
dc.title | Energy dependent saturation width of swift heavy ion shaped embedded Au nanoparticles | |
dc.type | Journal article | |
local.bibliographicCitation.issue | 11 | en_AU |
local.bibliographicCitation.lastpage | 3 | |
local.bibliographicCitation.startpage | 113107 | en_AU |
local.contributor.affiliation | Kluth, Patrick, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Giulian, Raquel, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Sprouster, David, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Schnohr, Claudia, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.affiliation | Byrne, Aidan, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Nuclear Physics, The Australian National University | en_AU |
local.contributor.affiliation | Cookson, D J, Australian Synchrotron Research Program, United States of America | en_AU |
local.contributor.affiliation | Ridgway, Mark C, College of Physical and Mathematical Sciences, CPMS Research School of Physics and Engineering, Department of Electronic Materials Engineering, The Australian National University | en_AU |
local.contributor.authoremail | patrick.kluth@anu.edu.au | en_AU |
local.contributor.authoruid | u4054452 | en_AU |
local.description.notes | Imported from ARIES | en_AU |
local.identifier.absfor | 020499 | en_AU |
local.identifier.ariespublication | u3488905xPUB175 | en_AU |
local.identifier.citationvolume | 94 | en_AU |
local.identifier.doi | 10.1063/1.3099971 | en_AU |
local.identifier.scopusID | 2-s2.0-63049097617 | |
local.identifier.thomsonID | 000264380300065 | |
local.identifier.uidSubmittedBy | u3488905 | en_AU |
local.publisher.url | https://www.aip.org/ | en_AU |
local.type.status | Published Version | en_AU |
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