The Contribution of Planes, Vertices, and Edges to Recombination at Pyramidally Textured Surfaces
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Baker-Finch, Simeon
McIntosh, Keith
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IEEE Electron Devices Society
Abstract
We present a methodology by which one may distinguish three key contributors to enhanced recombination at pyramidally textured silicon surfaces. First, the impact of increased surface area is trivial and equates to a √3-fold increase in Seff,UL•. Seco
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IEEE Journal of Photovoltaics
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Restricted until
2037-12-31