Isotextured silicon solar cell analysis and modeling 2: Recombination and device modeling

dc.contributor.authorBaker-Finch, Simeon
dc.contributor.authorMcIntosh, Keith
dc.contributor.authorTerry, Mason L
dc.contributor.authorWan, Yimao
dc.date.accessioned2015-12-10T23:23:30Z
dc.date.issued2012
dc.date.updated2016-02-24T08:45:57Z
dc.description.abstractWe extend our analysis of isotextured silicon solar cells by 1) examining experimentally the role played by isotexture in determining the surface recombination velocity at silicon surfaces and 2) combining these experimental results with our model for photogeneration in order to simulate in one dimension typical solar cell devices with isotextured surfaces. We examine both undiffused and diffused n-type isotextured silicon surfaces, and we find that the rate of surface recombination usually decreases with increasing isotexture etch depth. However, when undiffused surfaces are passivated with hydrogenated SiO 2or SiN x , surface recombination velocity is, counterintuitively perhaps, found to be independent of surface texturethis is despite a surface area that is up to 1.9-fold larger than a planar equivalent. We demonstrate the utility of our analysis of isotextured surfaces by simulating various device structures in one dimension. In one case, where device parameters are chosen to approximate a typical screen-printed cell with full-area back surface field, simulation results indicate that the optimal isotexture etch depth is 1-3μm. This optimum etch depth is slightly below the one deduced from published experimental results, indicating that surface recombination on samples observed in this study is uniquely independent of isotexture morphology.
dc.identifier.issn2156-3381
dc.identifier.urihttp://hdl.handle.net/1885/66984
dc.publisherIEEE Electron Devices Society
dc.sourceIEEE Journal of Photovoltaics
dc.subjectKeywords: Back surface fields; Cell analysis; Device modeling; Device parameters; Device structures; Etch depth; One dimension; Photogeneration; Screen-printed; Silicon surfaces; Surface area; Surface passivation; Surface recombination velocities; Surface recombina Photovoltaic cells; semiconductor device modeling; silicon; surface passivation; surface recombination; surface texture
dc.titleIsotextured silicon solar cell analysis and modeling 2: Recombination and device modeling
dc.typeJournal article
local.bibliographicCitation.issue4
local.bibliographicCitation.lastpage472
local.bibliographicCitation.startpage465
local.contributor.affiliationBaker-Finch, Simeon, College of Engineering and Computer Science, ANU
local.contributor.affiliationMcIntosh, Keith, PV Lighthouse
local.contributor.affiliationTerry, Mason L, Dupont Innovalight
local.contributor.affiliationWan, Yimao, College of Engineering and Computer Science, ANU
local.contributor.authoruidBaker-Finch, Simeon, u3938976
local.contributor.authoruidWan, Yimao, u4793143
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor090605 - Photodetectors, Optical Sensors and Solar Cells
local.identifier.absseo850504 - Solar-Photovoltaic Energy
local.identifier.ariespublicationf5625xPUB1378
local.identifier.citationvolume2
local.identifier.doi10.1109/JPHOTOV.2012.2204390
local.identifier.scopusID2-s2.0-84866742839
local.identifier.thomsonID000318428400009
local.type.statusPublished Version

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