High-resolution optical sampling of 640-Gb/s data using four-wave mixing in dispersion-engineered highly nonlinear As 2 S 3 planar waveguides

Date

2010

Authors

van Erps, Jurgen
Luan, F
Pelusi, Mark
Iredale, Tim
Madden, Steve
Bulla, Douglas
Luther-Davies, Barry
Thienpont, Hugo
Eggleton, Benjamin J
Choi, Duk-Yong

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Volume Title

Publisher

Institute of Electrical and Electronics Engineers (IEEE Inc)

Abstract

We present the first demonstration of an optical sampling system, using the optical Kerr effect in a chip-scale device, enabling combined capability for femtosecond resolution and broadband signal wavelength tunability. A temporal resolution <500 fs is achieved using four-wave mixing in a 7-cm-short chalcogenide planar waveguide. The use of a short length, dispersion-shifted waveguide with ultrahigh nonlinearity (104W-1·km-1) enables high-resolution optical sampling without the detrimental effect of chromatic dispersion on the temporal distortion of the signal and sampling pulses, as well as their phase mismatch. Using the device, we successfully monitor a 640-Gb/s optical time-division multiplexing (OTDM) datastream, showcasing its potential for integrated chip-based monitoring of signals at bitrates approaching and beyond Tb/s. We discuss fundamental limitations and potential improvements.

Description

Keywords

Keywords: Bitrates; Broadband signal; Chip-scale devices; Datastream; Detrimental effects; Femto-second resolution; Fundamental limitations; High resolution; Highly nonlinear; Non-Linearity; Optical planar waveguides; Optical sampling; Optical time division multipl Integrated optics; Nonlinear optics; Optical planar waveguides; Optical sampling

Citation

Source

Journal of Lightwave Technology

Type

Journal article

Book Title

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License Rights

DOI

10.1109/JLT.2009.2035338

Restricted until

2037-12-31