Multiple Scattering Effects on the EXAFS of Ge Nanocrystals
Date
2008
Authors
Araujo, Leandro
Ridgway, Mark C
Foran, Garry J
Journal Title
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Volume Title
Publisher
Munksgaard International Publishers
Abstract
We present a detailed extended x-ray absorption fine structure (EXAFS) spectroscopy study on the influence of multiple scattering effects on the analysis of bulk polycrystalline Ge (c-Ge) and of four Ge nanocrystal (NC) distributions with mean sizes from
Description
Keywords
Keywords: Extended X ray absorption fine structure spectroscopy; Germanium; Parameter estimation; Polycrystalline materials; Semiconductor quantum dots; Interatomic distance distributions; Structural parameters; Nanocrystals
Citation
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Source
Journal of Synchrotron Radiation
Type
Journal article
Book Title
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Restricted until
2037-12-31