Multiple Scattering Effects on the EXAFS of Ge Nanocrystals
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Araujo, Leandro
Ridgway, Mark C
Foran, Garry J
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Munksgaard International Publishers
Abstract
We present a detailed extended x-ray absorption fine structure (EXAFS) spectroscopy study on the influence of multiple scattering effects on the analysis of bulk polycrystalline Ge (c-Ge) and of four Ge nanocrystal (NC) distributions with mean sizes from
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Journal of Synchrotron Radiation
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Restricted until
2037-12-31