Surface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy

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dc.contributor.authorLau, Taim Soon (Kenny)
dc.contributor.authorLiu, Yun
dc.contributor.authorLi, Qian
dc.contributor.authorLi, Zhenrong
dc.contributor.authorWithers, Raymond
dc.contributor.authorXu, Zhuo
dc.date.accessioned2015-12-10T23:08:05Z
dc.date.issued2013
dc.date.updated2015-12-10T09:04:37Z
dc.identifier.issn2161-4881
dc.identifier.urihttp://hdl.handle.net/1885/63142
dc.publisherScientific Research Publishing, Inc.
dc.sourceJournal of Surface Engineered Materials and Advanced Technology
dc.titleSurface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy
dc.typeJournal article
local.bibliographicCitation.issue3
local.bibliographicCitation.lastpage194
local.bibliographicCitation.startpage190
local.contributor.affiliationLau, Taim Soon (Kenny), College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLiu, Yun, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLi, Qian, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationLi, Zhenrong, Xian Jiaotong University
local.contributor.affiliationWithers, Raymond, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationXu, Zhuo, Xi’an Jiaotong University
local.contributor.authoruidLau, Taim Soon (Kenny), u4813248
local.contributor.authoruidLiu, Yun, u4036265
local.contributor.authoruidLi, Qian, u4836728
local.contributor.authoruidWithers, Raymond, u8600734
local.description.embargo2037-12-31
local.description.notesImported from ARIES
local.identifier.absfor030206 - Solid State Chemistry
local.identifier.absseo970103 - Expanding Knowledge in the Chemical Sciences
local.identifier.ariespublicationu4005981xPUB774
local.identifier.citationvolume3
local.identifier.doi10.4236/jsemat.2013.33026
local.type.statusPublished Version

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