A practical approach to reactive ion etching
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Karouta, Fouad
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Institute of Physics Publishing
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In this paper, general aspects of the reactive ion etching (RIE) technique will be described, such as anisotropy, loading effect, lag effect, RIE chemistries and micro-masking, followed by a brief overview of etching dielectrics (SiOx, SiNx) and crystalline Si. The second section of the paper is dedicated to etching III-V compound semiconductors where, based on RIE results of GaN material, a simple and practical thermodynamic approach is exposed, explaining the criteria for selecting the best chemistry for etching a specific material and explaining the GaN etching results. Finally, a comprehensive study of etching InP-based materials using various chemistries will be discussed, as well as their various photonic applications.
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Journal of Physics D: Applied Physics
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2037-12-31
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