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Wafer surface charge reversal as a method of simplifying nanosphere lithography for RIE texturing of solar cells

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Authors

Inns, Daniel
Campbell, Patrick
Catchpole, Kylie

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Publisher

Hindawi Publishing Corporation

Abstract

A simplified nanosphere lithography process has been developed which allows fast and low-waste maskings of Si surfaces for subsequent reactive ion etching (RIE) texturing. Initially, a positive surface charge is applied to a wafer surface by dipping in a

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Advances in OptoElectronics

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Restricted until

2037-12-31