An ion-implanted InP receiver for polarization resolved terahertz spectroscopy
Date
2007-05-24
Authors
Castro-Camus, E
Lloyd-Hughes, J
Fu, Lan
Jagadish, Chennupati
Johnston, Michael B
Tan, Hark Hoe
Journal Title
Journal ISSN
Volume Title
Publisher
Optical Society of America
Abstract
We report on the construction, optical alignment and performance
of a receiver which is capable of recording the full polarization
state of coherent terahertz radiation. The photoconductive detector was
fabricated on InP which had been implanted with Fe+ ions. The device
operated successfully when it was gated with near infrared femtosecond
pulses from either a Ti:sapphire laser oscillator or a 1 kHz regenerative
laser amplifier. When illuminated with terahertz radiation from a typical
photoconductive source, the optimized device had a signal to noise figure
of 100:1 with a usable spectral bandwidth of up to 4 THz. The device
was shown to be very sensitive to terahertz polarization, being able to
resolve changes in polarization of 0.34 degrees. Additionally, we have
demonstrated the usefulness of this device for (i) polarization sensitive
terahertz spectroscopy, by measuring the birefringence of quartz and (ii)
terahertz emission experiments, by measuring the polarization dependence
of radiation generated by optical rectification in (110)-ZnTe.
Description
Keywords
polarization-sensitive devices, spectroscopy, far infrared, ultrafast devices
Citation
Optics Express 15.11 (2007): 7047-7057
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Source
Optics Express
Type
Journal article
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